Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

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Previous Title: Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium
Meeting Name: IEEE Semiconductor Thermal Measurement and Management Symposium.
Related Names: IEEE Components, Hybrids, and Manufacturing Technology Society.
Language(s): English
Published: New York, NY : IEEE, c1991-
Subjects: Integrated circuits > Integrated circuits / Congresses.
Amorphous semiconductors > Amorphous semiconductors / Thermal properties > Amorphous semiconductors / Thermal properties / Congresses.
Semiconductors > Semiconductors / Cooling > Semiconductors / Cooling / Congresses.
Semiconductors > Semiconductors / Thermal properties > Semiconductors / Thermal properties / Congresses.
Note: Also issued online.
Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
Physical Description: v. : ill. ; 29 cm.
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Item Link	Original Source
Limited (search only) 00CB37068 2000	University of Michigan
Limited (search only) 01CH37189 2001	University of Michigan
Limited (search only) 02CH37311 2002	University of Michigan
Limited (search only) 03CH37437 2003	University of Michigan
Limited (search only) 04CH37545 2004	University of Michigan
Limited (search only) 05CH37651 2005	University of Michigan
Limited (search only) 91CH2972-8 1991	University of Michigan
Limited (search only) 92CH3095-7 1992	University of Michigan
Limited (search only) 93CH3226-8 1993	University of Michigan
Limited (search only) 94CH3413-2 1994	University of Michigan
Limited (search only) 95CH35733 1995	University of Michigan
Limited (search only) 96CB35890 1996	University of Michigan
Limited (search only) 97CB36031 1997	University of Michigan
Limited (search only) 98CB36195 1998	University of Michigan
Limited (search only) 99CB36306 1999	University of Michigan

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