00619cam a22001697a 4500009235378MiAaHDL20101116000000.0m d cr bn ---auaua960828s1999 xx a b 000 0 eng dsdr-coo3546824(OCoLC)63893943NICNICNICKim, Hansuk,1970-Kinetics of silicide-induced crystallization of polycrystalline thin film transistors fabricated from amorphous chemical vapor deposition silicon /by Hansuk Kim.c1999.49 leaves :ill. ;28 cm.Thesis (M.S.) Cornell University, May, 1999.Including bibliographical references.Mode of access: Internet.00923537820101116161240.020101116000000.020120814073055.02025-04-15T17:30:53ZSDR-COOUNKNOWNloader.pl-001-001BKsdr-coo3546824cooSDRCOOcoo.31924086154014COO3546824COOCOO20250415googlecoo.319240861540141999icbibnon-US bib date1 >= 1931