01570cam a2200361 a 4500007291530MiAaHDL20250726000000.0m d cr bn ---auaua700225s1968 dcu b f001 0 eng 71600484 NLGGC20046762XNLGGC860722813(MiU)990072915300106381sdr-miu.990072915300106381sdr-uiuc.99634552512205899(MiU)MIU01000000000000007291530-goog(OCoLC)57540(OCoLC)499108736(MiU)Aleph007291530DLCDLCOCLCQLHLOCLCGNBSTNUtOrBLWNBSAC 13.46:465Bullis, W. Murray,1930-http://id.loc.gov/authorities/names/n80090215http://id.loc.gov/rwo/agents/n80090215Measurement of carrier lifetime in semiconductors :an annotated bibliography covering the period 1949-1967 /[by] W. Murray Bullis.Washington, D.C. :U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off.,1968.ii, 62 p. ;26 cm.texttxtrdacontentcomputercrdamediaonline resourcecrrdacarrierU.S. Bureau of Standards NBS technical note ;465Mode of access: Internet.SemiconductorsBibliography.http://id.loc.gov/authorities/subjects/sh2010112596United States.National Bureau of Standards.http://id.loc.gov/authorities/names/n79021148http://id.loc.gov/rwo/agents/n790211483901507728895200729153020241218063104.020250726000000.020260224140649.02026-02-25T06:53:35Z2025-11-26T18:50:03ZSDR-MIUmiuALMAprepare.pl-004-009BKsdr-miu.990072915300106381MiUSDRGWLA007291530mdp.39015077288952MIU990072915300106381MIUGWLA20260225googlemdp.390150772889521968pdbibUS fed docUIUUIUC20251006googleuiug.301121066556051968pdbibUS fed doc