Catalog Record: Measurement of carrier lifetime in...

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Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967 / [by] W. Murray Bullis.

Main Author:	Bullis, W. Murray, 1930-
Language(s):	English
Published:	Washington, D.C. : U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., 1968.
Subjects:	Semiconductors > Bibliography.
Physical Description:	ii, 62 p. ; 26 cm.
Original Format:	Book
Locate a Print Version:	Find in a library Find in a library

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