Catalog Record: Microelectronic test patterns: an overview

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Microelectronic test patterns: an overview / [by] Martin G. Buehler.

Main Author:	Buehler, Martin G.
Language(s):	English
Published:	[Washington, D.C.] : National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.] 1974.
Subjects:	Integrated circuits > Testing. Electronic apparatus and appliances > Testing.
Note:	"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."
Physical Description:	19 p. : illus. ; 26 cm.
Original Format:	Book
Locate a Print Version:	Find in a library Find in a library

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