02360cam a2200469 a 4500006865769MiAaHDL20250726000000.0m d cr bn ---auaua820217s1981 dcua b f000 0 eng c 80600197 $2.00AU@000042691719(MiU)990068657690106381sdr-miu.990068657690106381sdr-ucr.b16552039sdr-uiuc500024(MiU)MIU01000000000000006865769-goog(OCoLC)7664412(MiU)Aleph006865769DGPO/DLCDLCOCLCQBTCTANSBSPUtOrBLWNSBAC 13.10:400-65Mitchell, Michael A.Test patterns NBS-28 and NBS-28A :random fault interconnect step coverage and other structures /Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.Semiconductor measurement technology.Washington, D.C. :U.S. Dept. of Commerce, National Bureau of Standards :For sale by the Supt. of Docs., U.S. G.P.O.,1981.iv, 49 p. :ill. ;27 cm.texttxtrdacontentcomputercrdamediaonline resourcecrrdacarrierU.S. Department of Commerce National Bureau of Standards special publication ;400-65S/N 003-003-02297-7.Issued March 1981.""Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."Includes bibliographical references.Mode of access: Internet.Electronic apparatus and appliancesTesting.http://id.loc.gov/authorities/subjects/sh85042269Integrated circuitsTesting.http://id.loc.gov/authorities/subjects/sh2008123902Linholm, Loren W.Center for Electronics and Electrical Engineering (U.S.)http://id.loc.gov/authorities/names/n78089738http://id.loc.gov/rwo/agents/n78089738Air Force Wright Aeronautical Laboratories.http://id.loc.gov/authorities/names/n81037634http://id.loc.gov/rwo/agents/n81037634NBS special publication.http://id.loc.gov/authorities/names/n42017515http://id.loc.gov/rwo/agents/n420175153901507758600900686576920241218010259.020250726000000.020260303165447.02026-03-04T18:50:27Z2026-03-04T18:30:03ZSDR-MIUmiuALMAprepare.pl-004-009BKsdr-miu.990068657690106381MiUSDRGWLA006865769mdp.39015077586009MIU990068657690106381MIUGWLA20260304googlemdp.390150775860091981pdbibUS fed docUCUCR20260517googleuc1.312100235555741981pdbibUS fed docUIUUIUC20241231googleuiug.301120756936601981pdbibUS fed doc