Tools
A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
| Main Author: | Carver, G. P. |
|---|---|
| Other Authors: | Cullins, W. A. |
| Language(s): | English |
| Published: |
[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : 1981. |
| Subjects: |
Integrated circuits
> Testing.
Probes (Electronic instruments) |
| Note: |
"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." "Issued May 1981." S/N 003-003-02319-1. Item 247. |
| Physical Description: |
iv, 14 p. :
ill. ;
26 cm.
|
| Original Format: | Book |
| ISBN: |
|
| Locate a Print Version: |
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