02300cam a2200445 a 4500006865726MiAaHDL20250726000000.0m d cr bn ---auaua770128s1976 dcua b f100 0 eng 77608002 $1.45AU@000000847009(MiU)990068657260106381sdr-miu.990068657260106381sdr-ucr.b21136257sdr-uiuc227430(MiU)MIU01000000000000006865726-goog(OCoLC)2780854(MiU)Aleph006865726DLCDLCOCLOCLCQBTCTAOCLCGNSBSPUtOrBLWNSBAC 13.10:460Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy(1975 :National Bureau of Standards)Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy :proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975 /edited by K.F.J. Heinrich, D.E. Newbury, and H. Yakowitz ; sponsored by Analytical Chemistry Division, Institute for Materials Research, National Bureau of Standards.Washington, D.C. :U.S. Dept. of Commerce, National Bureau of Standards :For sale by the Supt. of Docs., U.S. Govt. Print. Off.,1976.vii, 164 p. :ill. ;27 cm.texttxtrdacontentcomputercrdamediaonline resourcecrrdacarrierU.S. Department of Commerce National Bureau of Standards special publication ;460"CODEN: XNBSAV."Includes bibliographical references.Mode of access: Internet.Monte Carlo methodCongresses.http://id.loc.gov/authorities/subjects/sh2010102348Scanning electron microscopyCongresses.Electron probe microanalysisCongresses.Yakowitz, Harvey,1939-http://id.loc.gov/authorities/names/n50013969http://id.loc.gov/rwo/agents/n50013969Newbury, Dale E.Heinrich, Kurt F. J.NBS special publication.http://id.loc.gov/authorities/names/n42017515http://id.loc.gov/rwo/agents/n420175153901507758661100686572620241218003104.020250726000000.020260311140653.02026-03-12T07:29:50Z2026-03-01T18:30:03ZSDR-MIUmiuALMAprepare.pl-004-009BKsdr-miu.990068657260106381MiUSDRGWLA006865726mdp.39015077586611MIU990068657260106381MIUGWLA20260312googlemdp.390150775866111976pdbibUS fed docUCUCR20260603googleuc1.312100192213891976pdbibUS fed docUIUUIUC20241231googleuiug.30112101555065no.4601976pdbibUS fed doc