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Use of Monte Carlo calculations in electron probe microanalysis and scanning electron microscopy : proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, Maryland, October 1-3, 1975 / edited by K.F.J. Heinrich, D.E. Newbury, and H. Yakowitz ; sponsored by Analytical Chemistry Division, Institute for Materials Research, National Bureau of Standards.
| Other Authors: | Heinrich, Kurt F. J. , Newbury, Dale E. , Yakowitz, Harvey, 1939- |
|---|---|
| Language(s): | English |
| Published: |
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : 1976. |
| Subjects: |
Electron probe microanalysis
> Congresses.
Scanning electron microscopy > Congresses. Monte Carlo method > Congresses. |
| Note: |
"CODEN: XNBSAV." |
| Physical Description: |
vii, 164 p. :
ill. ;
27 cm.
|
| Original Format: |
Book Conference |
| ISBN: |
|
| Locate a Print Version: |
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