02067cam a2200385Ji 4500003909663MiAaHDL20141009010000.0m d cr bn ---auaua750709s1975 dcua b f101 0 eng 75619223 ZWZ016725395AU@000000312029sdr-uiuc6267353sdr-miu.990039096630106381(OCoLC)1531448DLCDLCOCLOCLCQBTCTAAU@ZWZUIUUQC100.U57 no. 427QD96.M3389/.08 s545/.33C 13.10:427Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis(1974 :National Bureau of Standards)Secondary ion mass spectrometry :proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 /edited by K.F.J. Heinrich and D.E. Newbury.Washington :U.S. Dept. of Commerce, National Bureau of Standards :For sale by the Supt. of Docs., U.S. Govt. Print. Off.,1975.x, 227 p. :ill. ;26 cm.National Bureau of Standards special publication ;427"CODEN: XNBSAV."Includes bibliographical references and index.Mode of access: Internet.Analyse par microsondeCongrès.ramSpectrométrie de masse des ions secondairesCongrès.ramMicroprobe analysisCongresses.Secondary ion mass spectrometryCongresses.Newbury, Dale E.Heinrich, Kurt F. J.Online version:Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis (1974 : National Bureau of Standards)Secondary ion mass spectrometry.Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975(OCoLC)63287447800390966320100728131925.020141009010000.020141112162027.02024-12-31T19:11:33Z2024-12-31T18:30:02ZSDR-UIUCUNKNOWNloader.pl-003-020BKsdr-uiuc6267353uiugSDRUIUCuiug.30112101555115UIUno.4276267353UIUUIUC20241231googleuiug.30112101555115no.4271975pdbibUS fed docMIUGWLA20260301googlemdp.390150775858781975pdbibUS fed doc