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Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA / edited by George F. Vander Voort, John J. Friel.
| Other Authors: | Vander Voort, George F. , Friel, John J. |
|---|---|
| Language(s): | English |
| Published: |
Columbus, Ohio : International Metallographic Society ; c1996. |
| Subjects: |
Materials
> Testing
> Congresses
Nondestructive testing > Congresses Materials > Microscopy > Congresses Metallography > Congresses |
| Physical Description: |
vii, 125 p. :
ill. ;
29 cm.
|
| Original Format: |
Book Conference |
| Original Classification Number: | TA 410 .D481 1996 |
| ISBN: |
087170580X |
| Locate a Print Version: |
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